Nanotwinned materials are known for their enormous strength in combination with an outstanding ductility [1, 2]. Nevertheless, fundamental questions of their deformation behavior are still unanswered today. In the recent past it was proposed that screw dislocation transmit through coherent twin boundaries in copper by a cross-slip-like process. The process also quantitatively fits cross-slip: (i) the stress required for the constriction of two partial dislocations is identical to the transmission stress [3, 4], and (ii), the activation volume of dislocation slip transmission is similar to cross-slip [5]. However, these studies were conducted on a single coherent twin boundary on Cu.
Within this talk we will extend our findings for multiple twin boundaries in Ag. We will present physical vapour deposited Ag thin films with a twin spacing ranging from 20nm to 1µm. Besides the twin-size-scaling we will also discuss statistical aspects of dislocation slip transfer including the role of residual dislocations stored at twin boundaries as well as detwinning. Finally, we will propose a unique dislocation source mechanism at twin boundaries.